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An Analytical Approach for Compton-Rayleigh Scatter Peak Analysis for the Mars Science Laboratory Alpha Particle X-ray Spectrometer

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dc.contributor.advisor Gellert, Ralf
dc.contributor.author Tesselaar, Dustin
dc.date.accessioned 2015-11-20T18:53:40Z
dc.date.available 2016-09-25T05:00:16Z
dc.date.copyright 2015-08
dc.date.created 2015-09-25
dc.date.issued 2015-11-20
dc.identifier.uri http://hdl.handle.net/10214/9337
dc.description.abstract As part of a suite of complimentary science instruments onboard the Mars Science Laboratory rover, the alpha particle X-ray spectrometer (APXS) determines the chemical abundances of Martian rocks and soils for elements from Na to Y via particle induced X-ray emission and X-ray fluorescence. Due to attenuation effects, elements with Z < 11 cannot be directly detected. These invisible components can be quantified indirectly by the Compton-Rayleigh scatter-peaks in APXS spectra. This thesis focuses on the development of an analytical simulation program (CRAM) used to predict the Compton-Rayleigh ratio (C/R) for APXS spectra in a more timely manner than the existing Monte Carlo method (MarsGeom). The simulated C/R, when related to the experimental C/R, is used to quantify any excess or deficit of invisible components in APXS targets. The results of CRAM are compared to MarsGeom and both datasets agree, giving a limit of invisible component detection of approximately 5 wt%. en_US
dc.language.iso en en_US
dc.subject Compton Scattering en_US
dc.subject Rayleigh Scattering en_US
dc.subject Physics en_US
dc.subject APXS en_US
dc.subject Alpha Particle X-ray Spectrometer en_US
dc.subject XRF en_US
dc.subject PIXE en_US
dc.title An Analytical Approach for Compton-Rayleigh Scatter Peak Analysis for the Mars Science Laboratory Alpha Particle X-ray Spectrometer en_US
dc.type Thesis en_US
dc.degree.programme Physics en_US
dc.degree.name Master of Science en_US
dc.degree.department Department of Physics en_US
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