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Quantitative Trait Loci (QTL) for Common Bacterial Blight Resistance and Agronomic and Developmental Traits in Common Bean (Phaseolus vulgaris L.)

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Title: Quantitative Trait Loci (QTL) for Common Bacterial Blight Resistance and Agronomic and Developmental Traits in Common Bean (Phaseolus vulgaris L.)
Author: Diaz Castro, Esteban
Department: Department of Plant Agriculture
Program: Plant Agriculture
Advisor: Pauls, Peter K.Navabi, Alireza
Abstract: Common Bacterial Blight (CBB; caused by Xanthomonas axonopodis pv. phaseoli) is a major constraint in dry bean (Phaseolus vulgaris L.) production worldwide. Mapping of quantitative trait loci (QTL) can enable dissection of the genetic disease resistance and assist the development of cultivars with different sources of resistance. A population of recombinant inbred lines (RILs) of a cross between OAC Rex (CBB resistant) and OAC Seaforth (susceptible) was phenotyped in the field and genotyped using Single Nucleotide Polymorphism (SNP) markers. Composite Interval Mapping identified several QTL accounting for 2 - 61% of the phenotypic variation for CBB severity and developmental traits on chromosomes 1, 2, 4, 6, 8 and 11. CBB resistance was affected by physiological maturity and the speed a genotype reached maturity. The SNP markers identified with each of the CBB resistance loci may be used in the future for marker assisted selection to develop CBB resistant cultivars.
URI: http://hdl.handle.net/10214/9294
Date: 2015-09
Rights: Attribution-NoDerivs 2.5 Canada


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Attribution-NoDerivs 2.5 Canada Except where otherwise noted, this item's license is described as Attribution-NoDerivs 2.5 Canada