High-resolution pair distribution function method for analysis of amorphous and nanoparticle samples

Martin, Christopher J.
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University of Guelph

High resolution Pair Distribution Functions were generated for a number of amorphous and nanometer sized samples, included thin film amorphous germanium and gold nanoparticles of various sizes. X-ray diffraction data for each of these samples was collected on a customized setup on the A2 beamline at the Cornell High Energy Synchrotron Source, allowing for relatively fast data collection out to high momentum transfer magnitudes (Qmax=55 A?-1). A Fourier filtering method was developed to allow a high degree of automation in the analysis while still producing quantitative results. Data from a bulk gold sample was also analyzed as a reference material, verifying the success of this procedure.

Pair distribution function, High resolution, Amorphous samples, Nanoparticle samples, X-ray diffraction data